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dc.contributor.author |
Yanson, I.K. |
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dc.contributor.author |
Fisun, V.V. |
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dc.contributor.author |
Bobrov, N.L. |
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dc.contributor.author |
Mydosh, J.A. |
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dc.contributor.author |
van Ruitenbeek, J.M. |
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dc.date.accessioned |
2021-02-01T17:36:11Z |
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dc.date.available |
2021-02-01T17:36:11Z |
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dc.date.issued |
1998 |
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dc.identifier.citation |
Size-effect of Kondo scattering in point contacts (revisited) / I.K. Yanson, V.V. Fisun, N.L. Bobrov, J.A. Mydosh, J.M. van Ruitenbeek // Физика низких температур. — 1998. — Т. 24, № 7. — С. 654-660. — Бібліогр.: 27 назв. — англ. |
uk_UA |
dc.identifier.issn |
0132-6414 |
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dc.identifier.other |
PACS: 72.15.Qm, 72.10.Fk, 73.40.Ty, 75.20.Hr |
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dc.identifier.uri |
http://dspace.nbuv.gov.ua/handle/123456789/175545 |
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dc.description.abstract |
The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publication on nominally 0.1 at.% CuMn alloy [1,2]. The increase of width of the Kondo resonance and enhanced ratio of Kondo-peak intensity to electron-phonon scattering intensity is observed for contacts with sizes smaller than 10 nm. From the comparison of electron-phonon scattering intensity for the pressure-type contacts, which correspond to the clean orifice model, we conclude that the size effect is observed in clean contacts with the shape of a channel (nanowire). |
uk_UA |
dc.language.iso |
en |
uk_UA |
dc.publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
uk_UA |
dc.relation.ispartof |
Физика низких температур |
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dc.subject |
Электpонные свойства металлов и сплавов |
uk_UA |
dc.title |
Size-effect of Kondo scattering in point contacts (revisited) |
uk_UA |
dc.type |
Article |
uk_UA |
dc.status |
published earlier |
uk_UA |
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