Size-effect of Kondo scattering in point contacts (revisited)

Size-effect of Kondo scattering in point contacts (revisited)

Yanson, I.K. ; Fisun, V.V. ; Bobrov, N.L. ; Mydosh, J.A. ; van Ruitenbeek, J.M.

Тема: Электpонные свойства металлов и сплавов

Інший ID: PACS: 72.15.Qm, 72.10.Fk, 73.40.Ty, 75.20.Hr

URI: http://dspace.nbuv.gov.ua/handle/123456789/175545

Посилання: Size-effect of Kondo scattering in point contacts (revisited) / I.K. Yanson, V.V. Fisun, N.L. Bobrov, J.A. Mydosh, J.M. van Ruitenbeek // Физика низких температур. — 1998. — Т. 24, № 7. — С. 654-660. — Бібліогр.: 27 назв. — англ.

Дата: 1998

Завантажень: 174

Size-effect of Kondo scattering in point contacts (revisited)

Анотація:

The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publication on nominally 0.1 at.% CuMn alloy [1,2]. The increase of width of the Kondo resonance and enhanced ratio of Kondo-peak intensity to electron-phonon scattering intensity is observed for contacts with sizes smaller than 10 nm. From the comparison of electron-phonon scattering intensity for the pressure-type contacts, which correspond to the clean orifice model, we conclude that the size effect is observed in clean contacts with the shape of a channel (nanowire).

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