Kudryavtsev, Yu.V.; Uvarov, V.M.; Gontarz, R.; Dubowik, J.; Lee, Y.P.; Rhee, J.Y.; Makogon, Yu.N.; Pavlova, E.P.
(Успехи физики металлов, 2005)
The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main ...