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dc.contributor.author Kovalenko, S.A.
dc.date.accessioned 2017-06-10T08:12:12Z
dc.date.available 2017-06-10T08:12:12Z
dc.date.issued 1999
dc.identifier.citation Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS: 78.66; 78.20.C
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/119882
dc.description.abstract Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed. uk_UA
dc.description.sponsorship The author would like to emphasize his gratitude to Academician M.P. Lisitsa who is the supervisor and the author of the main idea of this work. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Optical properties of thin metal films uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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