Mathematical model of photoacoustic microscopy with piezoelectric detection

dc.contributor.author	Vertsanova, E.V.
dc.contributor.author	Yakimenko, Yu.I.
dc.date.accessioned	2017-06-10T08:03:15Z
dc.date.available	2017-06-10T08:03:15Z
dc.date.issued	1999
dc.identifier.citation	Mathematical model of photoacoustic microscopy with piezoelectric detection / E.V. Vertsanova, Yu.I. Yakimenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 41-44. — Бібліогр.: 6 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 61.72; 68.55.L; 78.66
dc.identifier.uri	http://dspace.nbuv.gov.ua/handle/123456789/119867
dc.description.abstract	Mathematical model is formulated for piezoelectric detection of the photoacoustics effect in optically semitransparent and thermally thick object with subsurface non-homogeneity in the case of free holding a piezodetector in a photoacoustic cell of the respective microscope. The model enables to estimate the influence of subsurface defects on the photoacoustical signal and to take into account the contribution of this factor into output signal of investigated objects.	uk_UA
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title	Mathematical model of photoacoustic microscopy with piezoelectric detection	uk_UA
dc.type	Article	uk_UA
dc.status	published earlier	uk_UA