Анотація:
Nanoscale tin dioxide (SnO₂) and zinc oxide (ZnO) layers are considered as
promising candidates for preparation of sensing elements for metal oxide semiconductor
gas sensors. Tin dioxide films deposited by direct current magnetron sputtering are
investigated. The influence of deposition temperature and annealing on the structure and
electrical properties of the tin dioxide films are considered. The development of design
and technological solution of active layer with high gas sensitivity, reproducibility and
stability is offered. Studies of effects of the pulse electrodeposition regimes on structural
and substructural parameters and on morphology of zinc oxide arrays made it possible to
identify modes that are optimal for formation of hierarchical nanostructures with large
specific surface area suitable for gas sensing applications.