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Morphologic and optical characterization of ZnO:Co thin films grown by PLD

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dc.contributor.author Vuichyk, M.V.
dc.contributor.author Tsybrii, Z.F.
dc.contributor.author Lavoryk, S.R.
dc.contributor.author Svezhentsova, K.V.
dc.contributor.author Virt, I.S.
dc.contributor.author Chizhov, A.
dc.date.accessioned 2017-05-30T05:44:28Z
dc.date.available 2017-05-30T05:44:28Z
dc.date.issued 2014
dc.identifier.citation Morphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ. uk_UA
dc.identifier.issn 1560-8034
dc.identifier.other PACS 68.37.Ps, 78.20.Ci, 78.30.-j
dc.identifier.uri http://dspace.nbuv.gov.ua/handle/123456789/118359
dc.description.abstract The morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure. uk_UA
dc.description.sponsorship This work was partially sponsored by Ukrainian-Russian Research Project “Developing of photo- and gas sensitive nanocomposites on the base of semiconductor oxides that are sensibilized by II-VI quantum dots”. uk_UA
dc.language.iso en uk_UA
dc.publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України uk_UA
dc.relation.ispartof Semiconductor Physics Quantum Electronics & Optoelectronics
dc.title Morphologic and optical characterization of ZnO:Co thin films grown by PLD uk_UA
dc.type Article uk_UA
dc.status published earlier uk_UA


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