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<title>TlBr: Carrier transport as influenced by defects and Tl ion migration</title>
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Kazukauskas, V.; Ziminskij, A.; Davidyuk, G.; Bozhko, V.; Mironchuk, G.
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Timoshevskii, A.N.; Yeremin, V.I.; Yablonovskii, S.O.
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Berzhansky, V.N.; Karavainikov, A.V.; Milyukova, E.T.; Prokopov, A.R.; Shaposhnikov, A.N.
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<title>Crystallization of a binary melt under the sample spontaneous cooling-down</title>
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Barannik, S.V.; Kanischev, V.N.
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