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<title>Functional Materials, 2013, № 2</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/114718</link>
<description/>
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<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/120075"/>
<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/120074"/>
<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/120073"/>
<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/120072"/>
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<dc:date>2026-04-13T02:26:52Z</dc:date>
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<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/120075">
<title>High-stable standard samples of mass in the nano-gram range</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/120075</link>
<description>High-stable standard samples of mass in the nano-gram range
Mikhailov, I.F.; Baturin, A.A.; Bugaev, Ye.A.; Mikhailov, A.I.; Borisova, S.S.
High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng.
</description>
<dc:date>2013-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/120074">
<title>Composite scintillation panels and elements based on fine-grained granules of crushed crystals</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/120074</link>
<description>Composite scintillation panels and elements based on fine-grained granules of crushed crystals
Litichevskyi, V.
The results of characteristics optimization of composite scintillation panels and elements for various applications have been presented. The dependences of the relative light yield intensity on particles size and thickness of the panel have been shown. The spatial resolution of the panels made of various fractions of the powder scintillator has been determined. The energy dependence on X-ray absorption efficiency of the scintillation panel based on ZnSe and the correspondence of effective thickness of the dispersed and single-crystal samples have been investigated. The results of the scintillation panels testing in the regime of registration of shadow images of biological and non-biological test objects under X-rays have been demonstrated. As a result of this work the composite scintillation material with improved properties of scintillation parameters homogeneity comparing with single-crystal ZnSe has been developed based on zinc selenide scintillator′s powder. This material was used in production of the composite scintillation panels and elements for X-ray detection by multichannel photodetectors.
</description>
<dc:date>2013-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/120073">
<title>Polishing of AlN/sapphire substrates obtained by thermochemical nitridation of sapphire</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/120073</link>
<description>Polishing of AlN/sapphire substrates obtained by thermochemical nitridation of sapphire
Vovk, E.A.; Budnikov, A.T.; Nizhankovskyi, S.V.; Kryvonogov, S.I.; Krukhmalev, A.A.; Dobrotvorskaya, M.V.
Physicochemical conditions and polishing suspension composition were established for polishing of AlN/sapphire templates obtained by thermochemical nitridation of sapphire. The use of the polishing suspension based on aerosil and KOH with pH 10.3 allowed to prepare the surface with a roughness Ra up to 1 nm. The morphology and element composition of AlN/sapphire surface at layer-by-layer removal of the nitridated layer were studied by the methods of atomic force microscopy and X-ray photoelectronic spectroscopy.
</description>
<dc:date>2013-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/120072">
<title>Electrostatic layer-by-layer assembly of poly-3,4-ethylene dioxythiophene functional nanofilms</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/120072</link>
<description>Electrostatic layer-by-layer assembly of poly-3,4-ethylene dioxythiophene functional nanofilms
Konopelnyk, O.I.; Aksimentyeva, O.I.; Dyakonov, V.P.; Piechota, S.; Opaynych, I.Ye.; Szymczak, H.
Method of electrostatic layer-by-layer assembly is used for preparation of the ultra thin functional films based on anionic complex of poly-3.4-ethylene dioxythiophene (PEDOT) — polystyrene sulfoacid (PSS) on the surface of the transparent indium-tin-oxide substrates. For the first time N-cetyl pyridinium chloride (CPC) was used as a cationic surfactant. It has been shown that nanofilms obtained in the presence of CPC demonstrate the optical properties and electrochemical behavior similar to PEDOT-PSS functional films that promises their application in electrochromic devices.
</description>
<dc:date>2013-01-01T00:00:00Z</dc:date>
</item>
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