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<title>Semicond. Physics Quantum Electronics &amp; Optoelectronics, 2009, № 2</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/114578</link>
<description/>
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<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/118696"/>
<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/118695"/>
<rdf:li rdf:resource="http://dspace.nbuv.gov.ua:80/handle/123456789/118694"/>
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<dc:date>2026-04-12T19:58:37Z</dc:date>
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<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/118696">
<title>Matrix model of inhomogeneous medium with circular birefringence in single scattering case</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/118696</link>
<description>Matrix model of inhomogeneous medium with circular birefringence in single scattering case
Savenkov, S.N.; Oberemok, Ye.A.; Yakubchak, V.V.; Barchuk, О.I.
The paper is devoted to the analysis of light scattering by inhomogeneous&#13;
circular birefringent media in a single scattering case. The object under investigation is a&#13;
circular birefringent crystalline slab with surface inhomogeneity. For the analysis, we&#13;
derive the Mueller matrix model for this media and use Cloude’s coherency matrix&#13;
method. Sample calculations are given for quartz SiO₂ and paratellurite TeO₂ .
</description>
<dc:date>2009-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/118695">
<title>Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/118695</link>
<description>Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters
Donets, V.V.; Melnichenko, L.Y.; Shaykevich, I.A.; Lomakina, O.V.
Offered in this work is the method to determine the thickness and refractive&#13;
index dispersion of thin antireflection films on absorbing substrates by using a spectral&#13;
dependence of reflectivity at normal light incidence. The method has been applied to&#13;
determine the above characteristics of thin antireflection films TiO₂ and Si₃N₄ on&#13;
surfaces of silicon photoelectric converters. The films were prepared by chemical&#13;
sedimentation. The obtained experimental data have been treated using a computer&#13;
program to deduce dispersion curves and thickness values. The results have been&#13;
interpreted.
</description>
<dc:date>2009-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/118694">
<title>Data acquisition, parameter extraction and characterization of active components using integrated instrumentation system</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/118694</link>
<description>Data acquisition, parameter extraction and characterization of active components using integrated instrumentation system
Bourdoucen, H.; Zitouni, A.
A data acquisition, parameter extraction and characterization system for&#13;
electronic active components is presented in this paper. High sensitivity measuring&#13;
equipments were used for data acquisition and effective extraction models based on&#13;
optimization techniques developed to obtain the parameters of p-n junction diodes,&#13;
Schottky diodes, field effect transistors and bipolar junction transistors. The performance&#13;
of the developed extraction techniques are apparent via comparing experimental data&#13;
with Spice simulated data using the model parameter that is graphically extracted and&#13;
also those extracted using optimization techniques. The performance of the developed&#13;
extraction techniques has been demonstrated by comparing the experimental&#13;
characteristics with Spice simulated curves using default parameters and model&#13;
parameters extracted using graphical and optimization techniques. The relative&#13;
excursions of the simulated I-V characteristics of most investigated devices were less&#13;
than 2.5 % with respect to the experimental curves, which shows the accuracy and&#13;
effectiveness of the developed system. A number of software routines have also been&#13;
implemented under Matlab environment to extract the Spice model parameters for&#13;
different electronic devices.
</description>
<dc:date>2009-01-01T00:00:00Z</dc:date>
</item>
<item rdf:about="http://dspace.nbuv.gov.ua:80/handle/123456789/118693">
<title>Hydrogenic impurity in a bilayer spherical quantum dot</title>
<link>http://dspace.nbuv.gov.ua:80/handle/123456789/118693</link>
<description>Hydrogenic impurity in a bilayer spherical quantum dot
Boichuk, V.I.; Bilynskyi, I.V.; Leshko, R.Ya.
In the work, on the basis of the exact solution of the Poisson equation for a&#13;
bilayer quantum dot with a positively charged donor ion in its centre, determined is the&#13;
potential energy of interaction of this impurity ion with electron, taking into account&#13;
different known values of Si and SiO₂ dielectric permittivities. Using the found potential&#13;
energy, the Schrödinger equation for the hydrogenic impurity in this system is solved&#13;
exactly. The influence of external and internal radii on the electron spectrum is&#13;
investigated. Described is the dependence of a squared matrix element for the dipole&#13;
moment of interlevel transitions on the external and internal radii of the&#13;
nanoheterosystem
</description>
<dc:date>2009-01-01T00:00:00Z</dc:date>
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