http://dspace.nbuv.gov.ua:80/handle/123456789/114442 2026-04-06T23:30:15Z 2026-04-06T23:30:15Z Rusinchuk, N.M. Lozovski, V.Z. Shydlovska, O.A. Zholobak, N.M. http://dspace.nbuv.gov.ua:80/handle/123456789/121608 2017-06-15T00:03:57Z 2016-01-01T00:00:00Z

Possible method for evaluation of virus, bacteria and yeasts infectivity by optical measurements Rusinchuk, N.M.; Lozovski, V.Z.; Shydlovska, O.A.; Zholobak, N.M. The possible method for evaluation of virus, bacteria and yeasts infectivity based on study of their absorption spectra has been proposed. The decrease in the samples infectivity was caused by adding the CeO₂ nanoparticles. Optical absorption of the samples was measured for the wavelength range from 400 to 750 nm. The obtained data detect the specific changes in absorption of the samples, which can be used for development of the new technique of evaluation of virus, bacteria and yeasts infectivity.

2016-01-01T00:00:00Z Kardashev, D.L. Kardashev, K.D. http://dspace.nbuv.gov.ua:80/handle/123456789/121607 2017-06-15T00:05:54Z 2016-01-01T00:00:00Z

Local vibrational density of states in disordered graphene Kardashev, D.L.; Kardashev, K.D. Local vibrational density of states for disordered graphene has been calculated via Green’s functions method. Disordered material has been modeled with Bethe lattice. Density of states does not include particularities specific for ideal graphene.

2016-01-01T00:00:00Z Malenko, A.S. Borovytsky, V.N. http://dspace.nbuv.gov.ua:80/handle/123456789/121606 2017-06-15T00:05:52Z 2016-01-01T00:00:00Z

Classic Ronchi test and its variants for quality control of various optical surfaces Malenko, A.S.; Borovytsky, V.N. Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured.

2016-01-01T00:00:00Z Studenyak, I.P. Kutsyk, M.M. Studenyak, V.I. Bendak, A.V. Izai, V.Yu. Kúš, P. Mikula, M. http://dspace.nbuv.gov.ua:80/handle/123456789/121605 2017-06-15T00:05:13Z 2016-01-01T00:00:00Z

Structural, electrical and optical investigations of Cu₆PS₅Br-based thin film deposited by HiTUS technique Studenyak, I.P.; Kutsyk, M.M.; Studenyak, V.I.; Bendak, A.V.; Izai, V.Yu.; Kúš, P.; Mikula, M. Cu₆.₃₅P₁.₇₇S₄.₇₂Br₀.₁₅ thin film was obtained using the high target utilization sputtering onto c-cut sapphire substrates. X-ray diffraction studies show the film to be amorphous with some crystalline inclusions. SEM investigations indicate formation of periodical “forest-like” quasi-two-dimensional pillared structure. Electrical conductivity of Cu₆.₃₅P₁.₇₇S₄.₇₂Br₀.₁₅ thin film was measured in the temperature interval 4.5…300 K, three regions with different activation energy were revealed. Optical constants were obtained using the technique of spectroscopic ellipsometry and used for calculation of optical absorption spectrum. Optical absorption edge has an exponential form, the Urbach energy shows the significant disordering in Cu₆.₃₅P₁.₇₇S₄.₇₂Br₀.₁₅ thin film.

2016-01-01T00:00:00Z