Посилання:Low temperature microhardness of Xe-intercalated fullerite C₆₀ / L.S. Fomenko, S.V. Lubenets1, V.D. Natsik, D. Cassidy, G.E. Gadd, S. Moricca, and B. Sundqvist // Физика низких температур. — 2005. — Т. 31, № 5. — С. 596-601. — Бібліогр.: 25 назв. — англ.
Підтримка:The authors would like to express their gratitude to
V.G. Manzhelii, M.A. Strzhemechny and A.I. Prokhvatilov
for their helpful discussion of the results and
to the STCU for partial financing of the research under
Project No. 2669.
The Vickers microhardness of Xe-intercalated polycrystalline fullerite C₆₀ (XexC₆₀, x ≃ 0.35)
is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness
of the material (by a factor of 2 to 3) as compared to that of pure C₆₀ single crystals is observed.
It is shown that the step-like anomaly in the temperature dependences of the microhardness
of pure C₆₀ single crystals recorded under the orientational fcc-sc phase transition (Tc ≃ 260 K) is
also qualitatively retained for XexC₆₀, but its onset is shifted by 40 K towards lower temperatures
and the step becomes less distinct and more smeared. This behavior of ̅NV(T) correlates with x-ray
diffraction data, the analysis of which revealed a considerable influence of xenon interstitial atoms
on the peculiar features of fullerite thermal expansion due to orientational phase transitions (see
the paper by A.I. Prokhvatilov et al. in this issue).