Перегляд за автором "Yurgelevych, I.V."

Сортувати за: Порядок: Результатів:

  • Ellipsometric study of ion implanted copper surface and its room temperature oxidation 
    Poperenko, L.V.; Lohner, T.; Stashchuk, V.S.; Khanh, N.Q.; Vinnichenko, M.V.; Yurgelevych, I.V.; Essam Ramadan Shaaban; Nosach, D.V. (Functional Materials, 2005)
    The room temperature oxidation of ion-implanted copper surface has been studied ex situ and in situ using ellipsometry. The ellipsometric parameters T and Д were measured at light incidence angle 75° for different wavelength ...
  • Optical parameters of the film naturally formed on the surface of cadmium telluride single crystals 
    Odarych, V.A.; Poperenko, L.V.; Yurgelevych, I.V.; Gnatyuk, V.A.; Toru Aoki (Functional Materials, 2013)
    Ellipsometric study of different surfaces of CdTe single crystals was carried out at a light wavelength of 632.8 nm. CdTe(110) crystals with cleaved surfaces after long time storage under ambient air conditions, Cd- and ...
  • Optical properties of TiAISiN based thin films 
    Nakonechna, O.I.; Poperenko, L.V.; Yurgelevych, I.V. (Functional Materials, 2005)
    Spectroellipsometric investigations of optical properties of TiAISiN based thin films have been performed. The dispersive dependences of the film optical conductivity о have been obtained in the 1-5 eV spectral range. The ...