Malykhin, S.V.; Makhlai, V.A.; Surovitskiy, S.V.; Borisova, S.S.; Herashchenko, S.S.; Kondratenko, V.V.; Kopylets, I.A.; Baturin, A.A.; Terentyev, D.
(Вопросы атомной науки и техники, 2019)
X-ray diffraction and SEM microscopy were used to study structural and phase changes in the surface layers of a Ti41.5Zr41.5Ni17 alloy bulk sample (target) and a thin film (deposited by magnetron sputtering of the target) ...