Romanets, P.M.; Belyaev, A.E.; Sachenko, А.V.; Boltovets, N.S.; Basanets, V.V.; Konakova, R.V.; Slipokurov, V.S.; Khodin, А.А.; Pilipenko, V.А.; Shynkarenko, V.V.; Kudryk, Ya.Ya.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)
The method of electrophysical diagnostic of n⁺-n-n⁺ structures at the etching stage of manufacturing process of power IMPATT diodes has been proposed. A numerical method for specific contacts resistance calculation of ...