Перегляд за автором "Pershyn, Y.P."

Сортувати за: Порядок: Результатів:

  • Growth and structure of WC/Si multilayer x-ray mirror 
    Pershyn, Y.P.; Chumak, V.S.; Shypkova, I.G.; Mamon, V.V.; Devizenko, A.Yu.; Kondratenko, V.V.; Reshetnyak, M.V.; Zubarev, E.N. (Вопросы атомной науки и техники, 2018)
    WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and cross-sectional ...
  • Structure and mechanical stresses in TaSi₂/Si multilayer 
    Devizenko, A.Yu.; Kopylets, I.A.; Kondratenko, V.V.; Pershyn, Y.P.; Devizenko, I.Y.; Zubarev, E.N.; Savitskiy, B.A. (Functional Materials, 2018)
    The structure, construction and mechanical stresses of the TaSi₂/Si multilayer manufactured by magnetron sputtering on the heated substrates were studied in the initial state and after thermal annealing. Deposition of ...