Il’ichev, E.; Smirnov, A.Yu.; Grajcar, M.; Izmalkov, A.; Born, D.; Oukhanski, N.; Wagner, Th.; Krech, W.; Meyer, H.-G.; Zagoskin, A.
(2004)
We implement the impedance measurement technique (IMT) for characterization of interferometer-
type superconducting qubits. In the framework of this method, the interferometer loop is inductively
coupled to a high-quality ...