Перегляд за автором "Odarych, V.A."

Результати 1-4 з 4

Determination of optical parameters of CdTe films by principal angle ellypsometry

Kornienko, K.N.; Odarych, V.A.; Poperenko, L.V.; Vuichik, N.V. (Functional Materials, 2006)

The principal angle and ellipticity of the light wave reflected from the surface of the single-crystal silicon coated by a CdTe film have been measured in 366-579 nm spectral region. Using a specially developed computer ...
Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

Odarych, V.A.; Sarsembaeva, A.Z.; Vuichyk, M.V.; Sizov, F.F. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)

The multiangular ellipsometric measurements were conducted at two wavelengths 435 and 579 nm on the system that contains cadmium telluride film deposited onto the monocrystalline silicon substrate. The refraction index and ...
Investigation of cadmium telluride films on silicon substrate

Odarych, V.A.; Sarsembaeva, A.Z.; Sizov, F.F.; Vuichyk, M.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)

Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index ...
Optical parameters of the film naturally formed on the surface of cadmium telluride single crystals

Odarych, V.A.; Poperenko, L.V.; Yurgelevych, I.V.; Gnatyuk, V.A.; Toru Aoki (Functional Materials, 2013)

Ellipsometric study of different surfaces of CdTe single crystals was carried out at a light wavelength of 632.8 nm. CdTe(110) crystals with cleaved surfaces after long time storage under ambient air conditions, Cd- and ...

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Перегляд за автором "Odarych, V.A."

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Перегляд за автором "Odarych, V.A."

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