Grigorashchenko, O.N.; Rudenkov, V.V.; Khizhnyi, I.V.; Savchenko, E.V.; Frankowski, M.; Smith-Gicklhorn, A.M.; Beyer, M.K.; Bondybey, V.E.
(Физика низких температур, 2003)
Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were ...