Tkachenko, V.F.; Dan`ko, A.Ya.; Puzikov, V.M.; Budnikov, A.T.; Lukienko, O.A.; Sidelnikova, N.S.; Adonkin, G.T.
(Functional Materials, 2007)
Using the precision technique of triple-crystal X-ray diffractometry, the structure of defect parts has been studied in large-size sapphire crystals grown by the horizontal directed crystallization in reducing gas media. ...