Перегляд за автором "Barcz, A."

Сортувати за: Порядок: Результатів:

  • Misiuk, A.; Barcz, A.; Ulyashin, A.; Prujszczyk, M.; Bak-Misiuk, J.; Formanek, P. (Физика и техника высоких давлений, 2010)
    Deuterium is accumulated by defects in nitrogen-implanted silicon (Si:N). This effect is investigated for Si:N processed at HT ≤ 1400 K, also under enhanced hydrostatic pressure, HP ≤ 1.1 GPa. Si:N was prepared from ...
  • Bak-Misiuk, J.; Romanowski, P.; Domagala, J.; Misiuk, A.; Dynowska, E.; Lusakowska, E.; Barcz, A.; Sadowski, J.; Caliebe, W. (2009)
    We report the results of defect structures studies of silicon implanted at different temperatures with Mn ions (Si:Mn) and of GaMnAs layers, next annealed under ambient and high pressures. An influence of annealing conditions ...
  • Misiuk, A.; Barcz, A.; Ulyashin, A.; Antonova, I.V.; Prujszczyk, M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)
    Hydrogen gettering by buried layers formed in oxygen-implanted silicon (Si:O prepared by O²⁺ implantation at the energy 200 keV and doses 10¹⁴ and 10¹⁷ cm⁻²) was investigated after annealing of Si:O at temperatures up ...
  • Misiuk, A.; Barcz, A.; Chow, L.; Bak-Misiuk, J.; Romanowski, P.; Shalimov, A.; Wnuk, A.; Surma, B.; Vanfleet, R.; Prujszczyk, M. (Физика и техника высоких давлений, 2008)
    Semiconductors doped with magnetically active atoms are expected to find application in spintronics. Si samples implanted with Mn⁺ (Si:Mn) or with V⁺ (Si:V) can order magnetically after processing at high temperature (HT) ...
  • Vlasov, A.P.; Bonchyk, A.Yu.; Fodchuk, I.M.; Barcz, A.; Swiatek, Z.T.; Zaplitnyy, R.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)
    Presented here are the results of studying the controlled doping with elements of V group of the periodic table, arsenic As and antimony Sb, of narrow gap CdxHg₁₋xTe epitaxial layers during the isothermal growth from the ...