Mikhailov, I.F.; Borisova, S.S.; Fomina, L.P.; Malykhin, S.V.; Babenko, I.N.
(Functional Materials, 2006)
The structure changes in nickel-on-silicon systems due to vacuum ultraviolet irradiation (VUV) have been studied using the X-ray reflectometry. An ultra-thin (1 to 2 nm) layer (of the density ρ = 3.2 to 3.4 g/cm³ at VUV ...