Kolyadina, E.Yu.; Konakova, R.V.; Matveeva, L.A.; Mitin, V.F.; Shynkarenko, V.V.; Atanassova, E.
(Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
The effect of short-term microwave treatment (MT) on the electronic
properties of interface in the Ta₂O₅−SiOx−p-Si structures has been investigated. The
samples of two types were studied: check ones (batch I) and those ...