Синельниченко, О.К.; Тишковець, Ж. I.; Карпець, М.В.; Хижун, О.Ю.
(2008)
X-ray photoelectron spectroscopy (XPS) is used to investigate the electronic structure of 3R−Nb1.14Se2 and 3R−MoSe2 compounds. For the mentioned compounds, the XPS valence-band and Nb(Mo)3d and Se3p core-level spectra are ...